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	<title>wet gluten content &#8211; BIOENGINEER.ORG</title>
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		<title>Handheld NIR Scanner and Bilinear Surface Model Crack Rapid Gluten Quality Testing in Whole Wheat Flour</title>
		<link>https://bioengineer.org/handheld-nir-scanner-and-bilinear-surface-model-crack-rapid-gluten-quality-testing-in-whole-wheat-flour/</link>
		
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		<pubDate>Mon, 05 Oct 2026 23:56:29 +0000</pubDate>
				<category><![CDATA[Chemistry]]></category>
		<category><![CDATA[bilinear surface model]]></category>
		<category><![CDATA[chemometrics]]></category>
		<category><![CDATA[food quality detection]]></category>
		<category><![CDATA[gluten index]]></category>
		<category><![CDATA[gluten quality]]></category>
		<category><![CDATA[LASSO regression]]></category>
		<category><![CDATA[Machine Learning]]></category>
		<category><![CDATA[near-infrared spectroscopy]]></category>
		<category><![CDATA[sample partitioning]]></category>
		<category><![CDATA[wet gluten content]]></category>
		<category><![CDATA[wheat breeding]]></category>
		<category><![CDATA[whole wheat flour]]></category>
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					<description><![CDATA[A handheld near-infrared spectrometer combined with a new bilinear surface model and covariance-guided sampling predicts five gluten quality indicators in whole wheat flour with test accuracies up to 0.98, offering a rapid nondestructive alternative to destructive standard methods.]]></description>
		
		
		
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